Proceedings of the ... Symposium for Testing and Failure Analysis
To test for the second location only, the affect of the light on the state of the output pin in question is desired. ... Only a change is made in the electrical connection. ... E . | , _ Figure 5 - Circuit Diagram of the area shown by arrow in figure 4.
| Title | : | Proceedings of the ... Symposium for Testing and Failure Analysis |
| Author | : | |
| Publisher | : | - 1993 |
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